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Your selections:
High-speed demodulation in multifrequency atomic force microscopy
- Harcombe, David M.
Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing
- Ruppert, Michael G., Moore, Steven I., Zawierta, Michal, Fleming, Andrew J., Putrino, Gino, Yong, Yuen K.
Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement
- Moore, Steven I., Ruppert, Michael G., Yong, Yuen Kuan
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